This search combines search strings from the content search (i.e. "Full Text", "Author", "Title", "Abstract", or "Keywords") with "Article Type" and "Publication Date Range" using the AND operator.
Beilstein J. Nanotechnol. 2023, 14, 175–189, doi:10.3762/bjnano.14.18
Figure 1: (a) Schematic of the metal tip–gap–semiconductor sample. (b) Energy band diagram of the metal–gap–s...
Figure 2: Schematic model of carrier emission and capture between the interface and bulk states of the semico...
Figure 3: (a) Equivalent circuit of the impedance model (SRH model) of the MIS structure. (b) Equivalent circ...
Figure 4: Block diagram of AFM and high–low KPFS. In low KPFS, a signal Vac·cos 2πfmt is generated by the osc...
Figure 5: Schematic of the silicon substrate with three types of impurity pattern, that is, n-, p-, and, n+-t...
Figure 6: (a) Surface topography and (b) CPD image of the pn-patterned Si surface. The CPD image was obtained...
Figure 7: (a) Δf(fm)–Vdc curves and (b) Δf–Vdc curves obtained on the n-type Si surface. The tip–sample dista...
Figure 8: Δf(fm)–Vdc curves obtained on the n-type Si surface at (a) Δfset = −200 Hz and (b) Δfset = −100 Hz....
Figure 9: (a) Δf(fm)–Vdc curves and (b) Δf–Vdc curves obtained on the p-type Si surface. The tip–sample dista...
Beilstein J. Nanotechnol. 2020, 11, 1750–1756, doi:10.3762/bjnano.11.157
Figure 1: AFM image (100 × 80 nm2) of the 16×2 reconstruction on Si(110). Solid and dotted rectangles represe...
Figure 2: (a) Atomic-resolution AFM image (8 × 8 nm2) of the 16×2 reconstruction area shown in Figure 1 (f0 = 162.5 k...
Figure 3: (a) An AFM image (7 × 6 nm2) of the 16×2 reconstruction surface with protrusions on L-P3 sites. Whi...
Figure 4: (a) An AFM image of the 16×2 reconstruction with the atomic lattice of the unreconstructed surface ...
Figure 5: Models of phase relationships between pentagons on the upper terrace (green) and those on the lower...